BS QC 750103:1990
Withdrawn
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for low-frequency amplification
Hardcopy , PDF
English
02-15-1990
04-25-2012
NO CONTENTS SECTION
Ratings, characteristics and inspection requirements to be included as mandatory requirements in accordance with BS QC 750100.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60747-7-2 (08/2005)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
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| BS 9000(1967) : LATEST | |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS 9970-0:1985 | Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS QC 750000(1986) : 1986 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
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