BS QC 750107:1991
Withdrawn
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Case-rated bipolar transistors for high-frequency amplifications
Hardcopy , PDF
English
11-15-1991
04-25-2012
NO CONTENTS SECTION
Forms part of the IEC Quality Assessment System for electronic components. It refers to discrete semi conductor devices and specifies quality assessment, test and measurement procedures. Deals with case rated bipolar transistors for high frequency amplifications.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Standards | Relationship |
| IEC 60747-7-4:1991 | Identical |
| BS 6493-1.7:1989 | Semiconductor devices. Discrete devices Recommendations for bipolar transistors |
| BS 6493-1.2:1984 | Semiconductor devices. Discrete devices Recommendations for rectifier diodes |
| BS 6493-1.1:1984 | Semiconductor devices. Discrete devices General |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS QC700000(1991) : 1991 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
| BS QC 750000(1986) : 1986 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
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