BS QC 750111:1991
Withdrawn
Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Bidirectional triode thyristors (triacs), ambient or case-rated, up to 100 A
Hardcopy , PDF
English
01-31-1992
04-25-2012
NO CONTENTS SECTION
Forms part of the IEC Quality Assessment System for electronic components. It refers to discrete semiconductor devices and specifies quality assessment, test and measurement procedures. Deals with bidirectional triode thyristors, ambient or case rated up to 100 A.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Standards | Relationship |
| IEC 60747-6-2:1991 | Identical |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| IEC 60068-2-17:1994 | Basic environmental testing procedures - Part 2-17: Tests - Test Q: Sealing |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
| IEC 60747-11:1985 | Semiconductor devices. Discrete devices. Part 11: Sectionalspecification for discrete devices |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.