BS QC 750112:1988
Withdrawn
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Semiconductor devices. Discrete devices. Field-effect transistors. Blank detail specification for single-gate field-effect transistors, up to 5 W and 1 GHz
Hardcopy , PDF
English
12-15-1988
04-25-2012
NO CONTENTS SECTION
Forms part of the IEC Quality Assessment System for electronic components. It refers to discrete semiconductor devices and specifies quality assessment, test and measurement procedures. Deals with field effect transistors.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60747-8-1 (08/2005)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| BS QC 750106:1993 | Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS 9970-0:1985 | Harmonized system of quality assessment for electronic components. Semiconductor devices Generic specification |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
| BS 6493-1.8:1985 | Semiconductor devices. Discrete devices Recommendations for field-effect transistors |
| BS QC 750000(1986) : 1986 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION |
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