BS QC 790105:1993
Current
Current
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Integrated circuit fusible-link programmable bipolar read-only memories
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
02-15-1992
Publisher
US$244.16
Excluding Tax where applicable
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60748-2-7 (08/2005)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| BS 3939-12:1985 | Guide for graphical symbols for electrical power, telecommunications and electronics diagrams Binary logic elements |
| BS QC790100(1991) : 1991 AMD 10586 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION FOR SEMICONDUCTOR INTEGRATED CIRCUITS EXCLUDING HYBRID CIRCUITS |
| BS 6493-3:1985 | Semiconductor devices Mechanical and climatic test methods |
| BS QC 001002:1991 | Rules of procedure of the IEC quality assessment system for electronic components (IECQ) |
| BS QC700000(1991) : 1991 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
Summarise
US$244.16
Excluding Tax where applicable
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