CECC 00803 : 1995
Superseded
View Superseded by
GUIDANCE DOCUMENT: VISUAL INSPECTION OF SOLDERED SURFACE MOUNTED ASSEMBLIES
01-12-2013
12-11-1998
1 Introduction
2 Scope
3 Related Documents
4 Terminology
4.1 Definitions
4.2 Abbreviations, letter symbols and signs
5 Pre-Assembly In-Process Visual Inspection
5.1 Method of Inspection
5.2 Unpopulated printed boards and surface mounting
components
5.3 Solder paste deposition
5.4 Non-Conductive Adhesive Deposition
5.5 Component Placement
5.6 Populated Board prior to Reflow Soldering/Adhesive Curing
6 Post Soldering Visual Inspection of Surface Mounted
Assemblies
6.1 Method of Inspection
6.2 General requirements for visual inspection of all SM
soldered components and assemblies
6.3 General requirements for visual inspection of SM soldered
assemblies
6.4 Visual inspection of SM component solder joints
Refers to visual inspection criteria for electronic assemblies containing surface mounted components.
| DocumentType |
Standard
|
| PublisherName |
Cenelec Electronic Components Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| BS CECC 00803:1996 | Identical |
| EN 160100 : 1997 | CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION) |
| BS EN 160100:1998 | Harmonized system of quality assessment for electronic components. Sectional specification: capability approval of manufacturers of printed board assemblies of assessed quality |
| BS EN 160200-2:1998 | Harmonized system of quality assessment for electronic components. Sectional specification. Microwave modular electronic units of assessed quality Index of test methods |
| I.S. EN 160200-2:1998 | MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 2: INDEX OF TEST METHODS (SECTIONAL SPECIFICATION) |
| I.S. EN 160100:1998 | CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION) |
| EN 160200-2 : 1997 | MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 2: INDEX OF TEST METHODS (SECTIONAL SPECIFICATION) |