CEI EN 60747-15 : 2012
Superseded
View Superseded by
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 15: ISOLATED POWER SEMICONDUCTOR DEVICES
Hardcopy , PDF
English
01-01-2012
01-29-2025
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Letter symbols
5 Essential ratings (limiting
values) and characteristics
6 Measurement methods
7 Acceptance and reliability
Annex A (informative) - Test
method of peak case
non-rupture current
Annex B (informative) - Measuring
method of the thickness
of thermal compound paste
Bibliography
Gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-100. (11/2012)
|
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 60747-15:2010 | Identical |
| EN 60747-15:2012 | Identical |
A newer version of this standard is available.
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