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CEI EN 60749-11 : 2004

Current

Current

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 11: RAPID CHANGE OF TEMPERATURE - TWO-FLUID-BATH METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2004

US$37.98
Excluding Tax where applicable
Summarise this standard

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Annex ZA (normative) - Normative
         references to international
         publications with their
         corresponding European
         publications

Defines the rapid change of temperature test method and the two-fluid-bath method.

Committee
CT 309
DevelopmentNote
Classificazione CEI 47-21 (04/2004) Supersedes CEI EN 60749. (05/2008)
DocumentType
Standard
Pages
16
PublisherName
Comitato Elettrotecnico Italiano
Status
Current
Supersedes

Standards Relationship
IEC 60749-11:2002 Identical
EN 60749-11:2002 Identical

US$37.98
Excluding Tax where applicable