CEI EN 60749-18 : 2004
Superseded
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 18: IONIZING RADIATION (TOTAL DOSE)
Hardcopy , PDF
English
01-01-2004
11-15-2019
FOREWORD
1 Scope
2 Terms and definitions
3 Test apparatus
4 Procedure
5 Summary
Describes a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total close) effects from a cobalt-60 ([60]Co) gamma ray source.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-24 (04/2004) Supersedes CEI EN 60749. (05/2008)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| EN 60749-18:2003 | Identical |
| IEC 60749-18:2002 | Identical |
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