CEI EN 60749-4:2017-10
Current
Current
Semiconductor devices - Mechanical and climatic test methods Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
10-01-2017
Publisher
US$54.69
Excluding Tax where applicable
The standard in question completely replaces the CEI EN 60749-4:2004-03 standard, which remains applicable until 07-04-2020.
| Committee |
CT 309
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8322-4002-1
|
| Pages |
18
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-4:2017 | Identical |
| EN 60749-4:2017 | Identical |
Summarise
US$54.69
Excluding Tax where applicable
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.