CEI EN 60749-6 : 2004
Superseded
View Superseded by
DISPOSITIVI A SEMICONDUTTORE - METODI PER PROVE CLIMATICHE E MECCANICHE - PARTE 6: IMMAGAZZINAMENTO AD ALTA TEMPERATURA
Hardcopy , PDF
English
01-01-2004
07-28-2025
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Summary
Bibliography
Defines the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-17 (04/2004) Supersedes CEI EN 60749. (05/2008) 1ED 2004 Edition is valid until 07-04-2020. (12/2017)
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC 60749-6:2017 | Identical |
| EN 60749-6:2017 | Identical |
A newer version of this standard is available.
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