CEI EN 61000-4-20 : 2013
Superseded
View Superseded by
ELECTROMAGNETIC COMPATIBILITY (EMC) - PART 4-20: TESTING AND MEASUREMENT TECHNIQUES - EMISSION AND IMMUNITY TESTING IN TRANSVERSE ELECTROMAGNETIC (TEM) WAVEGUIDES
Hardcopy , PDF
English, English - Italian
01-01-2013
12-22-2022
1 Scope and object
2 Normative references
3 Terms, definitions and abbreviations
4 General
5 TEM waveguide requirements
6 Overview of EUT types
7 Laboratory test conditions
8 Evaluation and reporting of test results
Annex A (normative) - Emission testing in
TEM waveguides
Annex B (normative) - Immunity testing in
TEM waveguides
Annex C (normative) - HEMP transient testing
in TEM waveguides
Annex D (informative) - TEM waveguide
characterization
Annex E (informative) - Calibration method for
E-field probes in TEM waveguides
Bibliography
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Describes emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides.
| Committee |
CT 210
|
| DevelopmentNote |
Classificazione CEI 210-78. (10/2004)
|
| DocumentType |
Standard
|
| Pages |
82
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 61000-4-20:2010 | Identical |
| EN 61000-4-20:2010 | Identical |
A newer version of this standard is available.
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