CEI EN 61967-2 : 2006
Current
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 2: MEASUREMENT OF RADIATED EMISSIONS - TEM CELL AND WIDEBAND TEM CELL METHOD
Hardcopy , PDF
English
01-01-2006
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
10 IC emissions reference levels
Annex A (informative) - Example calibration & set-up
verification sheet
Annex B (informative) - TEM cell and wideband TEM
cell descriptions
Annex C (informative) - Calculation of dipole moment
from measured data
Annex D (informative) - Specification of emissions
data
Bibliography
Annex ZA (normative) - Normative references to
international publications with their corresponding
European publications
Specifies a method for measuring the electromagnetic radiation from an integrated circuit (IC).
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-48. (08/2006)
|
| DocumentType |
Standard
|
| Pages |
30
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61967-2:2005 | Identical |
| EN 61967-2:2005 | Identical |
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