CEI EN 62415 : 2011
Current
SEMICONDUCTOR DEVICES - CONSTANT CURRENT ELECTROMIGRATION TEST
Hardcopy , PDF
English
01-01-2011
FOREWORD
1 Scope
2 Symbols, terms and definitions
3 Background
4 Sample size
5 Test structures
6 Test conditions
7 Failure criteria
8 Data analysis
Bibliography
Defines a method for conventional constant current electromigration testing of metal lines, via string and contacts.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 309-27. (07/2011)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62415:2010 | Identical |
| EN 62415:2010 | Identical |
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