CEI EN IEC 60749-13 : 2018
Current
Current
Semiconductor devices - Mechanical and climatic test methods Part 13: Salt atmosphere
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
03-26-2019
Publisher
US$50.64
Excluding Tax where applicable
Summarise this standard
AI-generated summary
This part of IEC 60749 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion.
| Committee |
CT 309
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-5369-4
|
| Pages |
0
|
| ProductNote |
THIS STANDARD IS ALSO REFERES TO :MIL-STD-883J
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-13:2018 | Identical |
| EN IEC 60749-13:2018 | Identical |
US$50.64
Excluding Tax where applicable
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