CEI EN IEC 60749-24:2026
Current
Current
Semiconductor devices - Mechanical and climatic test methods – Part 24: Accelerated moisture resistance - Unbiased HAST
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
02-01-2026
Publisher
US$37.98
Excluding Tax where applicable
Summarise this standard
AI-generated summary
This part of IEC 60749 specifies unbiased highly accelerated stress testing (HAST).
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8327-0862-0
|
| Pages |
18
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-24:2025 | Identical |
| EN IEC 60749-24:2026 | Identical |
US$37.98
Excluding Tax where applicable
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