CEI EN IEC 60749-28:2022
Current
Semiconductor devices - Mechanical and climatic test methods Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level
Hardcopy , PDF
English
11-01-2022
This part of IEC 60749 establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD).
| Committee |
CT 309
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8322-4494-4
|
| Pages |
56
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-28:2022 | Identical |
| EN IEC 60749-28:2022 | Identical |
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