CEI EN IEC 60749-41:2021
Current
Semiconductor devices - Mechanical and climatic test methods Part 41: Standard reliability testing methods of non-volatile memory devices
Hardcopy , PDF
English
05-01-2021
This part of IEC 60749 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification.
| Committee |
CT 309
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8322-8640-1
|
| Pages |
30
|
| ProductNote |
THIS STANDARD ALSO REFERS TO JEP122H,JEDEC Standard 22-A117
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| EN IEC 60749-41:2020 | Identical |
| IEC 60749-41:2020 | Identical |
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