CEI EN IEC 60749-5:2024
Current
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Hardcopy , PDF
English
04-01-2024
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
| Committee |
CT 309
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8322-8033-1
|
| Pages |
18
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN IEC 60749-5:2024 | Identical |
| IEC 60749-5:2023 | Identical |
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