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CEI EN IEC 61967-8:2023
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Integrated circuits - Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions - IC stripline method
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
10-01-2023
Publisher
This part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline.
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