CEN/TS 1071-10:2004

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Principle
5 Apparatus
   5.1 Scanning electron microscope (SEM)
   5.2 Optical microscope
6 Sample preparation
   6.1 Cross-section preparation
   6.2 Surface roughness
   6.3 Taper of cross-section
   6.4 Specimen tilt
   6.5 Coating damage
   6.6 Rounding of edges of the coating
   6.7 Overplating
   6.8 Etching
   6.9 Smearing
7 Calibration of instruments
   7.1 Procedure
   7.2 Photography
   7.3 Measurement
   7.4 Calculation of magnification
   7.5 Poor contrast
   7.6 Magnification
   7.7 Uniformity of magnification
   7.8 Stability of magnification
8 Test procedure
   8.1 General
   8.2 Preparation of images
       8.2.1 General
       8.2.2 Conventional photographic micrograph
       8.2.3 Digital images
   8.3 Measurement
   8.4 Thickness calculation
   8.5 Correction procedures
9 Measurement uncertainty
10 Expression of results
11 Reporting of results
Annex A (informative) General guidance on the preparation and
        measurement of cross-sections
      A.1 Introduction
      A.2 Cutting
      A.3 Mounting
      A.4 Grinding and polishing
      A.5 Use of the scanning electron microscope
Bibliography

This document specifies a method of measuring the thickness of ceramic coatings by means of examination of a metallographically prepared cross-section of the coating in a calibrated optical or scanning electron microscope. It draws strongly on EN ISO 9220 [8], modifying and updating as required to be relevant to ceramic coatings and current best practice.