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DD IEC/PAS 62396-2:2007

Superseded

Superseded

View Superseded by

Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

12-31-2007

Superseded date

10-31-2008

Superseded by

DD IEC/TS 62396-2:2008

US$450.07
Excluding Tax where applicable

Committee
GEL/107
DocumentType
Standard
Pages
24
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

US$450.07
Excluding Tax where applicable