DD IEC/TS 62396-5:2008
Superseded
View Superseded by
Process management for avionics. Atmospheric radiation effects Guidelines for assessing thermal neutron fluxes and effects in avionics systems
Hardcopy , PDF
English
10-31-2008
08-31-2014
| Committee |
GEL/107
|
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).