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DIN 45940-1132;CECC 90112:1989-02

Withdrawn

Withdrawn

HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS; BLANK DETAIL SPECIFICATION; MOS READ/WRITE DYNAMIC MEMORIES SILICON MONOLITHIC CIRCUITS

Published date

01-12-2013

Withdrawn date

05-01-2011

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DocumentType
Standard
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Withdrawn

Standards Relationship
CECC 90112 : 86 AMD 1 93 Corresponds
CECC 90112 : 86 AMD 1 93 Identical

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