DIN 50440-1:1981-11
Superseded
Superseded
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TESTING OF MATERIALS FOR SEMICONDUCTOR TECHNOLOGY; MEASUREMENT OF RECOMBINATION CARRIER LIFETIME IN SILICON SINGLE CRYSTALS BY MEANS OF PHOTO CONDUCTIVE DECAY METHOD; MEASUREMENT ON BAR SHAPED SPECIMENS
Published date
01-12-2013
Superseded date
11-01-1998
Superseded by
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| DocumentType |
Standard
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Superseded
|
| SupersededBy |
| ASTM F 1535 : 2000 | Standard Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance (Withdrawn 2003) |
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