DIN 50456-3:1999-08
Withdrawn
Withdrawn
TESTING OF MATERIALS FOR SEMICONDUCTOR TECHNOLOGY - METHOD FOR THE CHARACTERISATION OF MOULDING COMPOUNDS FOR ELECTRONIC COMPONENTS - PART 3: DETERMINATION OF CATIONIC IMPURITIES
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-1999
Withdrawn date
05-01-2015
Excluding Tax where applicable
This standard covers a method that determines the amounts of Na, K and Ca in heat-curing encapsulating compounds for electronic components. A liquid extract of the compound is obtained in an autoclave and then analysed to determine the cation concentration.
| DocumentType |
Standard
|
| Pages |
4
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Withdrawn
|
| DIN 12880-1:1978-11 | LABORATORY ELECTRICAL APPLIANCES - OVENS, SAFETY REQUIREMENTS AND TESTS, GENERAL TECHNICAL REQUIREMENTS |
| DIN 38406-22 E : 1988 | GERMAN STANDARD METHODS FOR THE EXAMINATION OF WATER, WASTE WATER AND SLUDGE - CATIONS (GROUP E) - DETERMINATION OF AG, AL, AS, B, BA, BE, BI, CA, CD, CO, CR, CU, FE, K, LI, MG, MN, MO, NA, NI, P, PB, S, SB, SE, SI, SN, SR, TI, V, W, ZN AND ZR BY INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY (E 22) |
| DIN 8120-1:1981-07 | WEIGHING MACHINES; TERMS AND DEFINITIONS |
| DIN 38406-22:1988-03 | GERMAN STANDARD METHODS FOR THE EXAMINATION OF WATER, WASTE WATER AND SLUDGE - CATIONS (GROUP E) - DETERMINATION OF AG, AL, AS, B, BA, BE, BI, CA, CD, CO, CR, CU, FE, K, LI, MG, MN, MO, NA, NI, P, PB, S, SB, SE, SI, SN, SR, TI, V, W, ZN AND ZR BY INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY (E 22) |
Summarise