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DIN EN 15991:2016-02

Withdrawn

Withdrawn

View Superseded by

Testing of ceramic and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV)

Available format(s)

Hardcopy , PDF

Language(s)

German, English

Published date

02-01-2016

Withdrawn date

11-02-2025

Superseded by

DIN EN 15991:2025-11

US$147.77
Excluding Tax where applicable

DevelopmentNote
Supersedes DIN 51096. (04/2011)
DocumentType
Standard
Pages
27
PublisherName
German Institute for Standardisation (Deutsches Institut für Normung)
Status
Withdrawn
SupersededBy
Supersedes

Standards Relationship
EN 15991:2015 Identical

DIN ISO 5725-2:2002-12 Accuracy (trueness and precision) of measurement methods and results - Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method (ISO 5725-2:1994 including Technical Corrigendum 1:2002)
ISO 5022:1979 Shaped refractory products — Sampling and acceptance testing
EN ISO 21068-1:2008 Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 1: General information and sample preparation (ISO 21068-1:2008)
ISO 5725-4:1994 Accuracy (trueness and precision) of measurement methods and results — Part 4: Basic methods for the determination of the trueness of a standard measurement method
ISO 21068-1:2008 Chemical analysis of silicon-carbide-containing raw materials and refractory products — Part 1: General information and sample preparation
ISO 5725-2:1994 Accuracy (trueness and precision) of measurement methods and results — Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
DIN ISO 5725-4:2003-01 ACCURACY (TRUENESS AND PRECISION) OF MEASUREMENT METHODS AND RESULTS - PART 4: BASIC METHODS FOR THE DETERMINATION OF THE TRUENESS OF A STANDARD MEASUREMENT METHOD
ISO 8656-1:1988 Refractory products — Sampling of raw materials and unshaped products — Part 1: Sampling scheme
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

US$147.77
Excluding Tax where applicable