DIN IEC 60747-16-4:2001-07 (Draft)
Superseded
Superseded
View Superseded by
DISCRETE SEMICONDUCTOR DEVICES - PART 16-4: TERMINOLOGY, ESSENTIAL RATINGS AND CHARACTERISTICS, AND MEASURING METHODS FOR INTEGRATED CIRCUIT MICROWAVE SWITCHES
Published date
01-12-2013
Superseded date
03-01-2005
Superseded by
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| DevelopmentNote |
DRAFT AMD 1 issued in October 2007 is superseded by DIN EN 60747-16-4 in August 2011. (08/2011)
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| DocumentType |
Draft
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| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
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| Status |
Superseded
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| SupersededBy |
Summarise
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