DIN IEC 60748-1:1988-01
Withdrawn
Withdrawn
SEMICONDUCTOR DEVICES; INTEGRATED CIRCUITS; PART 1: GENERAL
Published date
01-12-2013
Withdrawn date
11-01-2004
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| DevelopmentNote |
Supersedes DIN 41785-4, DIN 41795 and DIN 41857 (07/2002) Partially supersedes DIN 44480-1. (04/2003)
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| DocumentType |
Standard
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
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| Status |
Withdrawn
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| Supersedes |
| Standards | Relationship |
| IEC 60748-1:2002 | Identical |
| DIN EN 190100:1995-02 | SECTIONAL SPECIFICATION: DIGITAL MONOLITHIC INTEGRATED CIRCUITS |
| DIN EN 165000-1:1996-11 | FILM AND HYBRID INTEGRATED CIRCUITS - PART 1: GENERIC SPECIFICATION - CAPABILITY APPROVAL PROCEDURE |
| DIN EN 60749:2002-09 | SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS |
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