DS EN 60749-37 : 2008
Superseded
Superseded
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 37: BOARD LEVEL DROP TEST METHOD USING AN ACCELEROMETER
Published date
01-12-2013
Publisher
Superseded date
11-30-2022
Superseded by
Sorry this product is not available in your region.
Specifies a test method that is intended to evaluate and compare drop performance of surface mount electronic components for handheld electronic product applications in an accelerated test environment, where excessive flexure of a circuit board causes product failure.
| DocumentType |
Standard
|
| PublisherName |
Danish Standards
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 60749-37:2008 | Identical |
| EN 60749-37:2008 | Identical |
Summarise
Sorry this product is not available in your region.