DSCC 04220 F : 2020
Superseded
Superseded
View Superseded by
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, FIELD PROGRAMMABLE GATE ARRAY, 1,000,000 GATES, MONOLITHIC SILICON
Published date
03-19-2020
Publisher
Superseded date
12-29-2025
Superseded by
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| ProductNote |
THIS STANDARD ALSO REFERS TO JESD 51-7,IPC/JEDEC J-STD-002,TIA-644
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| JEDEC JESD 78E:2016 | IC LATCH-UP TEST |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
Summarise
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