DSCC 10206D:2021
Superseded
Superseded
View Superseded by
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2MEG X 39-BIT (80M), RADIATION-HARDENED, DUAL VOLTAGE SRAM, MULTICHIP MODULE
Published date
03-10-2021
Publisher
Superseded date
04-04-2026
Superseded by
Sorry this product is not available in your region.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Revision
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| ASTM F 1192 : 2011 : R2018 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| JEDEC JESD 78E:2016 | IC LATCH-UP TEST |
Summarise
Sorry this product is not available in your region.