DSCC 13212D:2026
Current
Current
MICROCIRCUIT, MEMORY, DIGITAL, CMOS/SOI, 16MBIT, RADIATION-HARDENED, NONVOLATILE RANDOM ACCESS MEMORY (NVRAM), MONOLITHIC SILICON
Published date
03-18-2026
Publisher
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Revision
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| PublisherName |
Defense Supply Centre Columbus
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| Status |
Current
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| Supersedes |
Summarise
Sorry this product is not available in your region.