DSCC 19206:2022
Superseded
Superseded
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MICROCIRCUIT, LINEAR, PRECISION, CMOS INPUT, RRIO, WIDE SUPPLY RANGE AMPLIFIERS, MONOLITHIC SILICON
Published date
03-28-2022
Publisher
Superseded date
12-30-2024
Superseded by
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| ProductNote |
This standard also refers to JESD22-C101.
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| ASTM F 1192 : 2011 : R2018 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| ANSI/ESDA/JEDEC JS-001:2017 | ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing - Human Body Model (HBM) - Component Level<br> |
| JEDEC JEP 155B:2018 | RECOMMENDED ESD TARGET LEVELS FOR HBM/MM QUALIFICATION |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-HDBK-103 Revision Z:2007 | List of Standard Microcircuit Drawings |
| JEDEC JEP 157 : 2009 | RECOMMENDED ESD-CDM TARGET LEVELS |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
Summarise
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