DSCC 96565E:2020
Superseded
Superseded
View Superseded by
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, SYNCHRONOUS 4-BIT UP/DOWN BINARY COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Published date
02-25-2020
Publisher
Superseded date
08-13-2025
Superseded by
Sorry this product is not available in your region.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
Summarise
Sorry this product is not available in your region.