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DSCC 96577D:2020

Superseded

Superseded

View Superseded by

MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, LOOK-AHEAD CARRY GENERATOR FOR COUNTERS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

Published date

03-10-2020

Superseded date

08-13-2025

Superseded by

DSCC 96577E:2025

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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).

DocumentType
Revision
PublisherName
Defense Supply Centre Columbus
Status
Superseded
SupersededBy

MIL-STD-883 Revision K:2016 Microcircuits
ASTM F 1192 : 2011 Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
MIL-HDBK-780 Revision D:2004 Standard Microcircuit Drawings
MIL-PRF-38535 Revision K:2013 Integrated Circuits (Microcircuits) Manufacturing, General Specification for
MIL-STD-1835 Revision D:2004 Electronic Component Case Outlines

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