DSCC 96583E : 2020
Superseded
Superseded
View Superseded by
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 9-BIT ODD/EVEN PARITY GENERATOR/CHECKER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
Published date
05-26-2020
Publisher
Superseded date
09-18-2025
Superseded by
Sorry this product is not available in your region.
This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Superseded
|
| SupersededBy |
| MIL-HDBK-780 Revision C:1997 | Standard Microcircuit Drawings |
| ASTM F 1192 : 2000 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-STD-883 Revision E:1996 | Microcircuits |
| MIL-STD-1835 Revision B:1996 | Electronic Component Case Outlines |
| MIL-PRF-38535 Revision F:2002 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
Summarise
Sorry this product is not available in your region.