DSCC 98537 G : 2019
Superseded
Superseded
View Superseded by
MICROCIRCUIT, MEMORY, DIGITAL, RADIATIONHARDENED, CMOS/SOI, 128K X 8 STATIC RAM, MONOLITHIC SILICON
Published date
05-28-2019
Publisher
Superseded date
01-29-2026
Superseded by
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This drawing documents two product assurance class levels consisting of high reliability (device class Q) and space application (device class V).
| Committee |
FSC 5962
|
| DocumentType |
Standard
|
| PublisherName |
Defense Supply Centre Columbus
|
| Status |
Superseded
|
| SupersededBy |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| ASTM F 1192 : 2011 | Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices |
| MIL-HDBK-780 Revision D:2004 | Standard Microcircuit Drawings |
| MIL-PRF-38535 Revision K:2013 | Integrated Circuits (Microcircuits) Manufacturing, General Specification for |
| JEDEC JESD 78E:2016 | IC LATCH-UP TEST |
| MIL-STD-1835 Revision D:2004 | Electronic Component Case Outlines |
Summarise
Sorry this product is not available in your region.