EN 165000-2:1996
Withdrawn
Film and hybrid integrated circuits - Part 2: Internal visual inspection and special tests
04-16-1996
03-01-1997
SECTION 1 INTERNAL VISUAL INSPECTION
1 General
1.1 Purpose
1.2 Sequence of inspection
1.3 Inspection apparatus
1.4 Inspection environment
1.5 Magnification
1.6 Definitions
1.7 Interpretation
1.8 Alternative test methods
2 substrate and processes
2.1 Substrate
2.2 Processes
2.2.1 Conductors
2.2.2 Isolating layer
2.2.3 Resistors
2.2.4 Foreign material
3 assembly - mechanical attachment and electrical
connection to parts of the substrate
3.1 Added components
3.2 Assembly method
3.2.1 General
3.2.2 Soldering and eutectic attachment
3.2.3 Organic adhesive
4 assembly - mechanical attachment and electrical
connection of substrate to package
4.1 General
4.2 Soldering and organic adhesive
5 wire interconnections
5.1 General
5.2 Gold ball and wedge bonds
5.3 Gold ball bonds
5.4 Tailless (crescent) bonds
5.5 Wedge bonds
5.6 Compound bonds
5.7 Beam lead bonds
5.8 Bonding wires
6 Foreign material
7 Selective organic protection
8 Figures
SECTION 2 RADIOGRAPHIC INSPECTION
1 General
2 Requirements
2.1 Views
2.2 Reports and records
2.3 Examination and acceptance criteria
SECTION 3 PARTICLE IMPACT NOISE DETECTION (PIND) TEST
1 Object
2 General
3 Equipment
4 Test procedure
5 Failure criteria
6 Lot acceptance
7 The detail specification
Not available
| Committee |
CLC/SR 47A
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| NF EN 165000-2:1996 | Identical |
| BS EN 165000-2:1996 | Identical |
| NEN EN 165000-2 : 1996 | Identical |
| PN EN 165000-2 : 2002 | Identical |
| NBN EN 165000-2 : 2008 | Identical |
| DIN EN 165000-2:1996-11 | Identical |
| I.S. EN 165000-2:1998 | Identical |
| UNE-EN 165000-2:1996 | Identical |