EN 60749-29:2003
Withdrawn
Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Published date
12-15-2003
Withdrawn date
12-01-2006
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Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing No Trouble Found and Electrical Overstress failures due to latch-up.
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| I.S. EN 60749-29:2003 | Equivalent |
| BS EN 60749-29:2003 | Equivalent |
| UNE-EN 60749-29:2004 | Identical |
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