EN 60749-32:2003
Current
Current
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Amended by
Published date
06-20-2003
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Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN 60749-32:2003 | Equivalent |
| BS EN 60749-32 : 2003 | Equivalent |
| UNE-EN 60749-32:2004 | Identical |
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