Name: EN 60749-4:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Brand: European Committee for Standards - Electrical

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Published date

08-13-2002

Publisher

European Committee for Standards - Electrical

Withdrawn date

07-01-2005

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Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

DocumentType	Standard
PublisherName	European Committee for Standards - Electrical
Status	Withdrawn

Standards	Relationship
BS EN 60749-4:2002	Equivalent
I.S. EN 60749-4:2002	Equivalent
UNE-EN 60749-4:2003	Identical

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EN 60749-4:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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