EN 60749-6:2002
Withdrawn
Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Published date
08-13-2002
Withdrawn date
07-01-2005
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Summarise this standard
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Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| BS EN 60749-6:2002 | Equivalent |
| I.S. EN 60749-6:2002 | Equivalent |
| UNE-EN 60749-6:2003 | Identical |
| BS EN 60749-6:2002 | Identical |
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