EN 60749-6:2002
Withdrawn
Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature
Published date
08-13-2002
Withdrawn date
07-01-2005
Sorry this product is not available in your region.
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| BS EN 60749-6:2002 | Equivalent |
| I.S. EN 60749-6:2002 | Equivalent |
| UNE-EN 60749-6:2003 | Identical |
| BS EN 60749-6:2002 | Identical |
Summarise
Sorry this product is not available in your region.