EN 60749-7:2002
Withdrawn
Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Published date
08-14-2002
Withdrawn date
07-01-2005
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Aims at testing and measuring the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. Applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace.
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Withdrawn
|
| Standards | Relationship |
| I.S. EN 60749-7:2002 | Equivalent |
| BS EN 60749-7:2002 | Equivalent |
| UNE-EN 60749-7:2003 | Identical |
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