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EN 60758:2016

EN 60758:2016

Current

Current

The latest, up-to-date edition.

Synthetic quartz crystal - Specifications and guidelines for use

Published date

09-23-2016

Publisher

European Committee for Standards - Electrical

FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Specification for synthetic quartz crystal
5 Specification for lumbered synthetic quartz crystal
6 Inspection rule for synthetic quartz crystal and
  lumbered synthetic quartz crystal
7 Guidelines for the use of synthetic quartz crystal for
  piezoelectric applications
Annex A (informative) - Frequently used sampling
        Procedures
Annex B (informative) - Numerical example
Annex C (informative) - Example of reference sample
        selection
Annex D (informative) - Explanations of point callipers
Annex E (informative) - Infrared absorbance Alpha value
        compensation
Annex F (informative) - Differences of the orthogonal
        axial system for quartz between IEC standard and
        IEEE standard
Annex G (informative) - Alpha value measurement
        consistency between dispersive infrared
        spectrometer and fourier transform infrared
        spectrometer
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

IEC 60758:2008(E) applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection. This fourth edition cancels and replaces the third edition, published in 2004. This edition constitutes a technical revision. It includes the following significant technical changes with respect to the previous edition: preparation of AT-cut slice sample for etching is changed to make it easier; etch channel grade classification is changed considering request of the user and explanation of quartz axes difference between IEEE and IEC is added as Annex F.

Committee
CLC/SR 49
DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Current

Standards Relationship
NF EN 60758 : 2013 Identical
IEC 60758:2016 Identical
NBN EN 60758 : 2016 Identical
NEN EN IEC 60758 : 2016 Identical
I.S. EN 60758:2016 Identical
PN EN 60758 : 2016 Identical
SN EN 60758:2016 Identical
UNE-EN 60758:2016 Identical
BS EN 60758:2016 Identical
CEI EN 60758 : 2010 Identical
DIN EN 60758:2013-06 (Draft) Identical

CEI EN 62276 : 2013 SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
BS EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
I.S. EN 62276:2016 SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATIONS - SPECIFICATIONS AND MEASURING METHODS
EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

IEC 60068-1:2013 Environmental testing - Part 1: General and guidance
ISO 15368:2001 Optics and optical instruments Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
EN 60068-1:2014 Environmental testing - Part 1: General and guidance
IEC 60410:1973 Sampling plans and procedures for inspection by attributes
IEC 60122-2:1983 Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification

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