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EN 62276:2013

Withdrawn

Withdrawn

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Published date

01-11-2013

Withdrawn date

11-23-2015

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IEC 62276:2012 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: - terms and definitions are rearranged in accordance with the alphabetical order; - 'reduced LN' is appended to terms and definitions; - 'reduced LT' is appended to terms and definitions; - reduction process is appended to terms and definitions.

DocumentType
Standard
PublisherName
European Committee for Standards - Electrical
Status
Withdrawn

Standards Relationship
BS EN 62276:2013 Equivalent
I.S. EN 62276:2013 Equivalent
DIN EN 62276:2013-08 Equivalent
BS EN IEC 62115:2020+A11:2020 Identical
UNE-EN 62276:2013 Identical

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