EN IEC 62969-4:2018
Current
Current
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 4: Evaluation method of data interface for automotive vehicle sensors
Published date
08-24-2018
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Summarise this standard
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IEC62969-4:2018 specifies a method of directly fault injection test for automotive semiconductor sensor interface that can be used to support the conformance assurance in the vehicle communications interface.
| Committee |
CLC/TC 47X
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Current
|
| Standards | Relationship |
| VDE 0884-69-4:2019-03 | Identical |
| DIN EN IEC 62969-4:2019-03 | Identical |
| BS EN IEC 62969-4:2018 | Identical |
| SS-EN IEC 62969-4:2018 | Identical |
| IEC 62969-4:2018 | Identical |
| PN-EN IEC 62969-4:2019 | Identical |
| NEN-EN-IEC 62969-4:2018 | Identical |
| NF EN IEC 62969-4:2018 | Identical |
| OVE EN IEC 62969-4: 2019 | Identical |
| CEI EN IEC 62969-4:2018-11 | Identical |
| I.S. EN IEC 62969-4:2018 | Equivalent |
| UNE-EN IEC 62969-4:2018 | Identical |
| BS EN 60893-3-7:2004+A1:2009 | Identical |
Sorry this product is not available in your region.