I.S. EN IEC 60749-37:2022
Current
Current
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
11-20-2022
Publisher
US$68.66
Excluding Tax where applicable
For Harmonized Standards, check the EU site to confirm that the Standard is cited in the Official Journal.
Only cited Standards give presumption of conformance to New Approach Directives/Regulations.
| DocumentType |
Standard
|
| Pages |
58
|
| PublisherName |
National Standards Authority of Ireland
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN IEC 60749-37:2022 | Equivalent |
| BS EN IEC 60749-37:2022 | Equivalent |
| IEC 60749-37:2022 | Equivalent |
Summarise
US$68.66
Excluding Tax where applicable
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