IEC 60147-0:1966
Withdrawn
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 0: General and terminology
Hardcopy , PDF
English - French, Russian
01-01-1966
12-31-2021
Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| Pages |
57
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| DIN 41854:1979-04 | Similar to |
| DIN 41786:1976-06 | Similar to |
| DIN 41853 : 1975 | Similar to |
| NEN 10147-0 : 1986 | Identical |
| NFC 96 112 : 81 AMD 1 81 | Similar to |
| NFC 96 113 : 1980 | Similar to |
| NFC 96 211 : 1979 | Similar to |
This standard has been withdrawn and is no longer current. No replacement edition is available.
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