IEC 60147-2:1963
Withdrawn
Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods
Hardcopy , PDF
English - French
01-01-1963
12-31-2021
Gives information based on current practice on measurements of certain device parameters and deals primarily with the parameters listed in IEC 147-1. It is intended that it will be eventually extended to cover all these parameters. This publication deals with transistors only.
| DocumentType |
Standard
|
| Pages |
55
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| NFC 96 112 : 81 AMD 1 81 | Similar to |
| NEN 10147-2 : 1986 | Identical |
| NFC 96 113 : 1980 | Similar to |
| NEN EN 100012 : 1995 | Identical |
This standard has been withdrawn and is no longer current. No replacement edition is available.
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